Registration Fee: FREE
Location: London, UK
Date: 13th March 2012
Attend this complimentary thought leadership seminar featuring reliability expert William Q. Meeker, PhD, and other analytics professionals. This half-day event will highlight trends in the statistical assessment of product reliability and share techniques to help you reach your maximum productivity with your analyses.
You’ll gain a better understanding of:
- Life Distribution Fitting
- Competing Cause Analysis
- Accelerated Life Testing
- Recurrence Analysis
- Degradation Studies
For more information, complete the form below.
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